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Modélisation et analyse numérique du réseau de résistance pour un aimant supraconducteur non isolé.

Modeling and numerical analysis of resistance network for non-insulated superconducting magnet.

Auteurs : BAI Z., ZU W., CHEN C., et al.

Type d'article : Article

Résumé

Non-insulated (NI) superconducting magnet may enhance transient stability of magnet coils and improve the self-protection ability, in which the resistance of adjacent turn-to-turn contact plays an important role. A resistance network model of NI superconducting magnet has been established in this paper. The equivalent total resistance has been numerically analyzed by using EDA software, and the influences of the total layer number and the turn number in each layer on the resistance value have been studied. By simulating the resistance network, we have acquired the variation trend of the equivalent total resistance when the total layer number is odd or even and found that the simulation results are basically consistent with the experimental results. The results show that when the total layer number of coils is odd, the total resistance first decreases down to the minimum and then increases with the increase of the layer number, and when the total odd layer number is lower than 9, the total resistance is greatly influenced by the turn number in each layer. When the total layer number is even, the total resistance increases with the increase of the layer number. However, whether odd or even, when the total layer number exceeds 25, the total resistance is little influenced by the turn number in each layer, and the total resistance is about a few multiples of the adjacent turn-to-turn contact resistance. These numerical analysis results will provide theoretical basis for the design of NI superconducting magnet.

Détails

  • Titre original : Modeling and numerical analysis of resistance network for non-insulated superconducting magnet.
  • Identifiant de la fiche : 30011536
  • Langues : Anglais
  • Source : Cryogenics - vol. 60
  • Date d'édition : 03/2014
  • DOI : http://dx.doi.org/10.1016/j.cryogenics.2014.01.001

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