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Flexible, automatic test system for characterizing superconducting junctions and devices.

Author(s) : DART D. L., MACFARLANE J. C., ANDRIKIDIS C., BINKS R. A., FOLEY C. P.

Type of article: Article

Summary

Fully automated measurements of resistance versus temperature, current versus voltage, and critical current versus applied field can be carried out on up to 8 devices in one cooldown cycle. Connections are made to the sample using spring contacts which eliminate the need for soldering to contact pads. One or two substrates with 10 connections per substrate can be placed in the probe at the one time. A microcomputer, 4 standard instruments and a specially designed probe and software has been incorporated.

Details

  • Original title: Flexible, automatic test system for characterizing superconducting junctions and devices.
  • Record ID : 1993-1855
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 63 - n. 6
  • Publication date: 1992/06
  • Document available for consultation in the library of the IIR headquarters only.

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