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Double-layer rotor magnetic shield performance analysis in high temperature superconducting synchronous generators under short circuit fault conditions.

Author(s) : HEKMATI A., ALIAHMADI M.

Type of article: Article

Summary

High temperature superconducting, HTS, synchronous machines benefit from a rotor magnetic shield in order to protect superconducting coils against asynchronous magnetic fields. This magnetic shield, however, suffers from exerted Lorentz forces generated in light of induced eddy currents during transient conditions, e.g. stator windings short-circuit fault. In addition, to the exerted electromagnetic forces, eddy current losses and the associated effects on the cryogenic system are the other consequences of shielding HTS coils. This study aims at investigating the Rotor Magnetic Shield, RMS, performance in HTS synchronous generators under stator winding short-circuit fault conditions. The induced eddy currents in different circumferential positions of the rotor magnetic shield along with associated Joule heating losses would be studied using 2-D time-stepping Finite Element Analysis, FEA. The investigation of Lorentz forces exerted on the magnetic shield during transient conditions has also been performed in this paper. The obtained results show that double line-to-ground fault is of the most importance among different types of short-circuit faults. It was revealed that when it comes to the design of the rotor magnetic shields, in addition to the eddy current distribution and the associated ohmic losses, two phase-toground fault should be taken into account since the produced electromagnetic forces in the time of fault conditions are more severe during double line-to-ground fault.

Details

  • Original title: Double-layer rotor magnetic shield performance analysis in high temperature superconducting synchronous generators under short circuit fault conditions.
  • Record ID : 30021127
  • Languages: English
  • Source: Cryogenics - vol. 80
  • Publication date: 2016/10
  • DOI: http://dx.doi.org/10.1016/j.cryogenics.2016.10.005

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