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STRUCTURE OF THIN LAYERS OF SOLIDIFIED NITROGEN-XENON, NITROGEN-KRYPTON BINARY MIXTURES.

[In Russian. / En russe.]

Author(s) : KOVALENKO S. I., KRUPSKIJ I. N., SOLODOVNIK A. A.

Type of article: Article

Summary

STRUCTURE OF SOLID NITROGEN-XENON, NITROGEN-KRYPTON MIXTURES WAS STUDIED USING TRANSMISSION ELECTRON DIFFRACTION TECHNIQUE. THE STUDIES WERE PERFORMED IN THE TEMPERATURE RANGE 2.5 TO 30 K ON SAMPLES PREPARED AT 2.5, 20, 25, AND 28 K BY WAY OF DEPOSITING FROM THE GAS. IT IS FOUND THAT THE DEPOSITION TEMPERATURE, THE COMPOSITION AS WELL AS THE ACCOMPANYING ANNEALING INFLUENCE THE STRUCTURE OF THE CONDENSATES. THE CHARACTER OF THE PHASE DIAGRAMS OF THE SYSTEM UNDER STUDY HAS BEEN ELUCIDATED FROM EXPERIMENTAL DATA. IT IS SHOWN THAT THE ORIENTATIONAL ORDER OF THE N2 MOLECULES DETERIORATES AS THE RARE GAS CONTENT INCREASES. THE OBSERVED DETERIORATION OCCURS DURING SAMPLE GROWTH.

Details

  • Original title: [In Russian. / En russe.]
  • Record ID : 1982-1112
  • Languages: Russian
  • Source: Fiz. nizk. Temp. - vol. 7 - n. 11
  • Publication date: 1981
  • Document available for consultation in the library of the IIR headquarters only.

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