ShareSummary
The microscope with a spatial resolution of less than 5 micrometers has been designed for on-chip in-situ investigations of the working properties of normal and superconducting circuits and devices. The instrument relies on the detection of the electrical response of the circuit to a very localized heating induced by irradiation with 675 nanometers wavelength light from a semiconductor laser. The microscope can be operated in the temperature range 2-300 K using a standard temperature controller.
Details
- Original title: A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions.
- Record ID : 1996-2095
- Languages: English
- Source: Rev. sci. Instrum. - vol. 66 - n. 9
- Publication date: 1995/09
- Document available for consultation in the library of the IIR headquarters only.
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Indexing
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VOLTAGE CONTRAST AT 6 K IN A SCANNING ELECTRON ...
- Author(s) : SADORF H.
- Date : 1987
- Languages : English
- Source: Cryogenics - vol. 27 - n. 11
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Resonant macroscopic quantum tunneling in Josep...
- Author(s) : OVCHINNIKOV Y. N., SILVESTRINI P., RUGGIERO B., BARONE A.
- Date : 1992/10
- Languages : English
- Source: J. Supercond. - vol. 5 - n. 5
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Thin-film technology for high-critical temperat...
- Author(s) : KAWASAKI M.
- Date : 1996
- Languages : Japanese
- Source: Cryogenics/ Cryog. Eng. - vol. 31 - n. 11
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Progress of packaging technologies for supercon...
- Author(s) : SUZUKI H.
- Date : 2009
- Languages : Japanese
- Source: Journal of the Cryogenic Society of Japan - vol. 44 - n. 6
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Atomic physics: cold meeting at a junction.
- Author(s) : SACKETT C. A.
- Date : 2007/10/04
- Languages : English
- Source: Nature - vol. 449 - n. 7162
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