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The microscope with a spatial resolution of less than 5 micrometers has been designed for on-chip in-situ investigations of the working properties of normal and superconducting circuits and devices. The instrument relies on the detection of the electrical response of the circuit to a very localized heating induced by irradiation with 675 nanometers wavelength light from a semiconductor laser. The microscope can be operated in the temperature range 2-300 K using a standard temperature controller.
Details
- Original title: A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions.
- Record ID : 1996-2095
- Languages: English
- Source: Rev. sci. Instrum. - vol. 66 - n. 9
- Publication date: 1995/09
- Document available for consultation in the library of the IIR headquarters only.
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VOLTAGE CONTRAST AT 6 K IN A SCANNING ELECTRON ...
- Author(s) : SADORF H.
- Date : 1987
- Languages : English
- Source: Cryogenics - vol. 27 - n. 11
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Thin-film technology for high-critical temperat...
- Author(s) : KAWASAKI M.
- Date : 1996
- Languages : Japanese
- Source: Cryogenics/ Cryog. Eng. - vol. 31 - n. 11
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Progress of packaging technologies for supercon...
- Author(s) : SUZUKI H.
- Date : 2009
- Languages : Japanese
- Source: Journal of the Cryogenic Society of Japan - vol. 44 - n. 6
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Ultrafast superconductor digital electronics: R...
- Author(s) : LIKHAREV K. K.
- Date : 1996
- Languages : English
- Source: Proceedings of the 21st international conference on low temperature physics.
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Low temperature scanning laser microscope for s...
- Author(s) : ZHURAVEL A. P., SIVAKOV A. G., LUKASHENKO A. V., DMITRENKO I. M.
- Date : 1996
- Languages : English
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