A TEMPERATURE-VARIABLE SAMPLE ROTATING CRYOSTAT IN HIGH MAGNETIC FIELDS.

Author(s) : NOTO K., LEE Z. H., TOYOTA N.

Type of article: Article

Summary

THIS CRYOSTAT HAS BEEN DEVELOPED IN ORDER TO MEASURE THE ANGULAR AND TEMPERATURE DEPENDENCE OF THE UPPER CRITICAL FIELD IN SEVERAL SINGLE CRYSTAL CHEVREL PHASE SUPERCONDUCTORS. THE TEMPERATURE OF THE SAMPLE CAN BE VARIED FROM 2 TO 15 K WITHIN AN ACCURACY OF + OR -10 MILLIK. THE SAMPLE CAN BE ROTATED IN AN ADIABATIC VACUUM CAN AROUND A HORIZONTAL AXIS AT THE CENTRE OF SUPERCONDUCTING MAGNETS UP TO 16.5 T WITHIN AN ACCURACY OF + OR -1 DEG.

Details

  • Original title: A TEMPERATURE-VARIABLE SAMPLE ROTATING CRYOSTAT IN HIGH MAGNETIC FIELDS.
  • Record ID : 1984-0015
  • Languages: English
  • Source: Cryogenics/ Cryog. Eng. - vol. 23 - n. 4
  • Publication date: 1983

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