ShareClosed-cycle refrigerator-cooled scanning SQUID microscope for room-temperature samples.
Author(s) : FLEET E. F., CHATRAPHORN S., WELLSTOOD F. C., et al.
Type of article: Article
Summary
The authors have designed, built and operated a scanning superconducting quantum interference device (SQUID) microscope that uses a closed-cycle refrigerator to cool a YBCO dc SQUID to 77 K. The SQUID is mounted in custom vacuum housing that has a thin sapphire window that maintains thermal isolation of the SQUID while allowing samples to be imaged in air at room temperature. Samples are mounted on an x-y scanning table and can be brought to within about 60 microm of the SQUID for magnetic field imaging. The authors describe the performance of the system and present images of a variety of samples.
Details
- Original title: Closed-cycle refrigerator-cooled scanning SQUID microscope for room-temperature samples.
- Record ID : 2003-0587
- Languages: English
- Source: Rev. sci. Instrum. - vol. 72 - n. 8
- Publication date: 2001/08
- Document available for consultation in the library of the IIR headquarters only.
Links
See the source
Indexing
-
Themes:
Low-temperature physics;
Superconduction - Keywords: Low temperature; Squid (cryogenics); Microscopy
-
UNIAXIAL STRESS DEVICE FOR USE WITH A SQUID MAG...
- Author(s) : OSTERMAN D. P., WILLIAMSON S. J.
- Date : 1985
- Languages : English
- Source: Rev. sci. Instrum. - vol. 56 - n. 1
View record
-
Compact large-range cryogenic scanner.
- Author(s) : SIEGEL J., WITT J., VENTURI N., FIELD S.
- Date : 1995/03
- Languages : English
- Source: Rev. sci. Instrum. - vol. 66 - n. 3
View record
-
Scanning tunneling microscopy and spectroscopy ...
- Author(s) : SUDEROW H., GUILLAMNON I., MALDONADO A., et al.
- Date : 2011/08/21
- Languages : English
- Source: Proceedings of the 23rd IIR International Congress of Refrigeration: Prague, Czech Republic, August 21-26, 2011. Overarching theme: Refrigeration for Sustainable Development.
- Formats : PDF
View record
-
Low-temperature noncontact atomic-force microsc...
- Author(s) : SUEHIRA N., TOMIYOSHI Y., SUGAWARA Y., et al.
- Date : 2001/07
- Languages : English
- Source: Rev. sci. Instrum. - vol. 72 - n. 7
View record
-
Low temperature scanning laser microscope for s...
- Author(s) : ZHURAVEL A. P., SIVAKOV A. G., LUKASHENKO A. V., DMITRENKO I. M.
- Date : 1996
- Languages : English
View record