ShareCOMPUTER CONTROLLED LOW TEMPERATURE RESISTANCE MEASUREMENTS.
Author(s) : BACIOCCO E., BORAGNO C., VALBUSA U.
Type of article: Article
Summary
A SIMPLE SYSTEM FOR MEASURING ELECTRICAL RESISTANCE VERSUS TEMPERATURE IN THE RANGE 1-20 K IS DESCRIBED. IT IS BASED ON THE USE OF A LOCK-IN AMPLIFIER SR 510 (STANFORD RESEARCH) INTERFACED WITH A PERSONAL COMPUTER IBM AT. MEASUREMENTS IN THE RANGE 10 MEGAOHMS-1 KILO-OHM DISSIPATING 1 NANOWATT-0.1 PICOWATT WITH AN ACCURACY BETTER THAN 1% CAN BE CARRIED OUT ON 8 SAMPLES AT THE SAME TIME.
Details
- Original title: COMPUTER CONTROLLED LOW TEMPERATURE RESISTANCE MEASUREMENTS.
- Record ID : 1990-1818
- Languages: English
- Source: Cryogenics - vol. 29 - n. 3
- Publication date: 1989
Links
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Indexing
- Themes: Thermodynamic measurements
- Keywords: Semiconductor; Cryotemperature; Measurement; Thermometry; Electrical resistance
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ELECTRICAL RESISTANCE OF SCREW-FASTENED THERMAL...
- Author(s) : OKAMOTO T.
- Date : 1990
- Languages : English
- Source: Rev. sci. Instrum. - vol. 61 - n. 4
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LOW-TEMPERATURE SEMICONDUCTOR RESISTANCE THERMO...
- Author(s) : LOGVINENKO S. P., ROSSOSHANSKII O. A.
- Date : 1985
- Languages : English
- Source: Cryogenics - vol. 25 - n. 5
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CARBON COMPOSITION RESISTORS FOR CRYOGENIC THER...
- Author(s) : COSMO V. de
- Date : 1987
- Languages : English
- Source: Rev. sci. Instrum. - vol. 58 - n. 3
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A CARBON RESISTANCE THERMOMETER WITH FAST RESPO...
- Author(s) : ESKA G., NEUMAIER K.
- Date : 1983
- Languages : English
- Source: Cryogenics - vol. 23 - n. 2
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A SIMPLE ENGINEERING CALIBRATION FOR PLATINUM R...
- Author(s) : GERALD R. II
- Date : 1983
- Languages : English
- Source: Cryogenics - vol. 23 - n. 2
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