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CRITICAL CURRENT DENSITY AND FLUX SHEAR MECHANISMS.

Author(s) : KAHAN A.

Type of article: Article

Summary

AN ANALYSIS IS MADE OF THE MAGNETIC FIELD DEPENDENCE OF THE SUPERCONDUCTING CRITICAL CURRENT DENSITY, BASED ON FLUX SHEAR MECHANISM MODELS PROPOSED BY KRAMER, EVETTS AND PLUMMER, AND DEW-HUGHES, USING SHEAR ELASTIC MODULUS EXPRESSIONS DERIVED BY LABUSCH AND BY BRANDT. PARAMETER VALUES ARE SENSITIVE TO THE EXTENT OF THE MAGNETIC FIELD RANGE AND ALSO TO MATHEMATICAL MINIMIZATION TECHNIQUES, AND VARY BY AS MUCH AS 50%. IT WAS FOUND THAT ONLY 2 COMBINATIONS, EVETTS-PLUMMER-BRANDT AND DEW-HUGHES-LABUSCH, YIELD ACCEPTABLE FITS AND REALISTIC PARAMETER VALUES. BASED ON NEUTRON IRRADIATION RESULTS, IT IS CONCLUDED THAT THE DEW-HUGHES-LABUSCH FORMULATION IS THE PREFERRED MODEL.

Details

  • Original title: CRITICAL CURRENT DENSITY AND FLUX SHEAR MECHANISMS.
  • Record ID : 1991-2399
  • Languages: English
  • Source: Cryogenics - vol. 30 - n. 8
  • Publication date: 1990

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