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Critical currents in YBCO(7-) thin films containing screw dislocations.

Author(s) : DOUWES H., KES P. H., GERBER C., MANNHART J.

Type of article: Article

Summary

Flux pinning by dislocations and (oxygen) vacancies is considered. Expressions for the corresponding elementary pinning forces are given and estimates concerning their strengths are made. In order to check the model, the critical current was measured on a film with a certain screw dislocation density by means of transport and irreversible magnetization measurements. At low fields (0.05 and 0.075 T), the temperature dependence of measured critical current density could be well described by pinning due to screw dislocations, whereas at higher fields (up to 6 T) the temperature dependence resembled that for pinning due to oxygen vacancies, though the agreement was less satisfactory.

Details

  • Original title: Critical currents in YBCO(7-) thin films containing screw dislocations.
  • Record ID : 1994-0043
  • Languages: English
  • Source: Cryogenics - vol. 33 - n. 5
  • Publication date: 1993/05

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