Share

CURRENT FLOW IN SUPERCONDUCTOR-SEMICONDUCTOR-SUPERCONDUCTOR JUNCTIONS.

[In Russian. / En russe.]

Author(s) : GUBANKOV V. N., KOVTONJUK S. A., KOSELEC V. P.

Type of article: Article

Summary

THE TRANSFER OF AN ELECTRIC CHARGE IN THIN-FILM NIOBIUM-SILICON-LEAD SUPERCONDUCTING JUNCTIONS IS INVESTIGATED FOR VARIOUS THICKNESSES OF THE SILICON LAYER BETWEEN 25 AND 85 ANGSTROMS. THE BEHAVIOUR OF SUCH JUNCTIONS DIFFERS FROM THAT OF SUPERCONDUCTING JUNCTIONS WITH A DIELECTRIC OR NORMAL METAL LAYER. THE SPECIFIC PROPERTIES OF THE TEMPERATURE DEPENDENCE CAN BE ASCRIBED TO RESONANCE TUNNELING OF COOPER PAIRS IN THE PRESENCE OF SUB-BARRIER LOCALIZED STATES ARISING AS THE RESULT OF THE AMORPHOUS STRUCTURE OF THE LAYER.

Details

  • Original title: [In Russian. / En russe.]
  • Record ID : 1986-0486
  • Languages: Russian
  • Source: Z. eksp. teor. Fiz. - vol. 89 - n. 4
  • Publication date: 1985
  • Document available for consultation in the library of the IIR headquarters only.

Links


See other articles in this issue (3)
See the source

Indexing