DESIGN OF A CRYOSTAT FOR THE TRANSPORT PROPERTIES IN THIN FILMS.
Author(s) : SHAH S. S., CHANDOLE S. V.
Type of article: Article
Summary
THE STUDY OF ELECTRICAL PROPERTIES (CONDUCTIVITY, THERMOELECTRIC POWER, PHOTOCONDUCTIVITY, HALL COEFFICIENT, MAGNETORESISTANCE) OF THIN AND AMORPHOUS SEMICONDUCTING FILMS HAS BECOME VERY IMPORTANT. IN GENERAL ONE HAS TO MEASURE THESE PROPERTIES AGAIN AND AGAIN AT LOW TEMPERATURES. THE DESIGN OF A CRYOSTAT IS REPORTED WHICH CAN BE USED FOR MEASURING MOST OF THE TRANSPORT PROPERTIES AT LOW TEMPERATURES UP TO LIQUID NITROGEN TEMPERATURE.
Details
- Original title: DESIGN OF A CRYOSTAT FOR THE TRANSPORT PROPERTIES IN THIN FILMS.
- Record ID : 1984-0016
- Languages: English
- Source: Indian J. Cryog. - vol. 6 - n. 2
- Publication date: 1981
- Document available for consultation in the library of the IIR headquarters only.
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