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Improvement of hysteresis-losses in internal-tin diffusion processed niobium-tin wires.

[In Japanese. / En japonais.]

Author(s) : KUBO Y., EGAWA K., NAGAI T., UCHIKAWA F., TAGUCHI O., MORITA M.

Type of article: Article

Summary

Recently, the authors have successfully elucidated the growth mechanism of bridging, which was the cause of generating large losses in internal-tin processed wires. Bridging was completely suppressed by decreasing the diameter of the tin core to 82% and losses in those wires were decreased to 172-193 kilojoules/m3.

Details

  • Original title: [In Japanese. / En japonais.]
  • Record ID : 1998-0780
  • Languages: Japanese
  • Source: Cryogenics/ Cryog. Eng. - vol. 31 - n. 6
  • Publication date: 1996
  • Document available for consultation in the library of the IIR headquarters only.

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