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Low-temperature scanning tunneling microscope with a reliable piezoelectrical coarse approach mechanism.

Author(s) : ALTFEDER I. B., VOLODIN A. P.

Type of article: Article

Summary

The tip translation device is based on a new principle of sequential and parallel longitudinal step motions of the balanced frictional supports of the scanning tunneling microscope tip. The instrument was successfully tested in a temperature range from 0.4 to 300 K. The design is well suited for low-temperature applications.

Details

  • Original title: Low-temperature scanning tunneling microscope with a reliable piezoelectrical coarse approach mechanism.
  • Record ID : 1994-2058
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 64 - n. 11
  • Publication date: 1993/11
  • Document available for consultation in the library of the IIR headquarters only.

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