ShareLow-temperature scanning tunneling microscope with a reliable piezoelectrical coarse approach mechanism.
Author(s) : ALTFEDER I. B., VOLODIN A. P.
Type of article: Article
Summary
The tip translation device is based on a new principle of sequential and parallel longitudinal step motions of the balanced frictional supports of the scanning tunneling microscope tip. The instrument was successfully tested in a temperature range from 0.4 to 300 K. The design is well suited for low-temperature applications.
Details
- Original title: Low-temperature scanning tunneling microscope with a reliable piezoelectrical coarse approach mechanism.
- Record ID : 1994-2058
- Languages: English
- Source: Rev. sci. Instrum. - vol. 64 - n. 11
- Publication date: 1993/11
- Document available for consultation in the library of the IIR headquarters only.
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Low-temperature scanning tunnelling microscope ...
- Author(s) : WILDOER J. W. G., ROY A. J. A. van, KEMPEN H. van, HARMANS C. J. P. M.
- Date : 1994/09
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 9
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A low temperature, ultrahigh vacuum, microwave-...
- Author(s) : STRANICK S. J., KAMNA M. M., WEISS P. S.
- Date : 1994/10
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 10
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New variable low-temperature scanning tunnellin...
- Author(s) : SMITH A. R., SHIH C. K.
- Date : 1995/03
- Languages : English
- Source: Rev. sci. Instrum. - vol. 66 - n. 3
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Low-temperature scanning tunnelling microscope ...
- Author(s) : HENDERSON G. N., FIRST P. N., GAYLORD T. K., GLYTSIS E. N., RICE B. J., DANTZSCHER P. L., GUTHRIE D. K., HARRELL L. E., CAVE J. S.
- Date : 1995/01
- Languages : English
- Source: Rev. sci. Instrum. - vol. 66 - n. 1
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A simple low-temperature ultrahigh-vacuum scann...
- Author(s) : MEYER G.
- Date : 1996/08
- Languages : English
- Source: Rev. sci. Instrum. - vol. 67 - n. 8
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