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Low-temperature scanning tunnelling microscope for ballistic electron emission microscopy (BEEM) and spectroscopy.

Author(s) : HENDERSON G. N., FIRST P. N., GAYLORD T. K., GLYTSIS E. N., RICE B. J., DANTZSCHER P. L., GUTHRIE D. K., HARRELL L. E., CAVE J. S.

Type of article: Article

Summary

Salient features are: 1) operation on a liquid-helium storage dewar to below 6 K; 2) a lateral positioning range of 5 mm at low temperature; and 3) lateral drift rate less than 0.2 nm/h at the lowest temperatures. For BEEM spectroscopy, the microscope's high positional stability allows extended signal-averaging at a single location on the sample.

Details

  • Original title: Low-temperature scanning tunnelling microscope for ballistic electron emission microscopy (BEEM) and spectroscopy.
  • Record ID : 1996-0677
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 66 - n. 1
  • Publication date: 1995/01
  • Document available for consultation in the library of the IIR headquarters only.

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