Low-temperature scanning tunnelling microscope for use on artificially fabricated nanostructures.

Author(s) : WILDOER J. W. G., ROY A. J. A. van, KEMPEN H. van, HARMANS C. J. P. M.

Type of article: Article

Summary

In order to be able to position the tip above the structure of interest, a searching strategy has been developed. The authors describe design and operation of the microscope and demonstrate searching.

Details

  • Original title: Low-temperature scanning tunnelling microscope for use on artificially fabricated nanostructures.
  • Record ID : 1995-3377
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 65 - n. 9
  • Publication date: 1994/09
  • Document available for consultation in the library of the IIR headquarters only.

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