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MEASUREMENT OF CONDENSATION HEAT TRANSFER IN A THERMOSIPHON.

Author(s) : ZHOU X., COLLINS R. E.

Type of article: Article

Summary

A NOVEL TECHNIQUE IS DESCRIBED FOR STUDYING VAPOUR CONDENSATION IN A TWO-PHASE REFLUX THERMOSIPHON. THE TECHNIQUE INVOLVES ACCURATE MEASUREMENT OF THE THICKNESS OF THE CONDENSED LIQUID FILM USING A ROTATING NEEDLE CONTACT METHOD. FOR LAMINAR FLOW OF THIS LIQUID THIS INFORMATION CAN BE USED TO DETERMINE THE SPATIAL DEPENDENCE OF HEAT FLUX IN THE CONDENSER. THE VALIDITY OF THE METHOD IS DEMONSTRATED BY THE AGREEMENT BETWEEN THE RESULTS IT GIVES AND THOSE PREDICTED FOR A CALCULABLE CONDENSER SYSTEM, AND BY THE DIRECT MEASUREMENT OF THE TEMPERATURE DIFFERENCE ACROSS THE KNOWN THERMAL IMPEDANCE OF THE CONDENSER WALL.

Details

  • Original title: MEASUREMENT OF CONDENSATION HEAT TRANSFER IN A THERMOSIPHON.
  • Record ID : 1992-0554
  • Languages: English
  • Source: International Journal of Heat and Mass Transfer - vol. 34 - n. 2
  • Publication date: 1991/02

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