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Standard reference devices for high-temperature superconductor (HTS) critical current measurements.

Author(s) : GOODRICH L. F., SRIVASTAVA A. N., STAUFFER T. C.

Type of article: Article

Summary

Obtaining repeatable critical-current measurements for a HTS is a challenging task, since they are highly susceptible to degradation due to mechanical stress, moisture, thermal cycling and aging. The paper discusses the development of a high-temperature superconducting standard reference device (SRD), at the National Institute of Standards and Technology, to address these measurement concerns. An SRD is an HTS specimen that has had its critical current non-destructively evaluated. Because HTSs are sensitive to mechanical alterations, minor changes in sample preparation or mounting procedure could yield large changes in the measured critical current. Preliminary data on SRDs made using bismuth-based oxide tapes (2212) with a silver substrate are presented. Differences between two consecutive measurements of critical current can typically change by 40%; these deviations have been reduced to about 4%.

Details

  • Original title: Standard reference devices for high-temperature superconductor (HTS) critical current measurements.
  • Record ID : 1994-3372
  • Languages: English
  • Source: Cryogenics - vol. 33 - n. 12
  • Publication date: 1993/12

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