IIR document
The influence of structural defects on the critical current of the high-temperature superconducting tapes.
Author(s) : SOSNOWSKI J.
Summary
The continuous progress in the construction of high temperature superconducting tapes already allows the use of these materials in numerous electric devices. However, in the technological process of winding the coil for an electric apparatus the bending stress arises of the superconducting tape. It will lead to the generation of mechanical, structural defects, which influence the critical current. The paper is devoted to the analysis of this effect. A new model of the transport current properties of the high-temperature superconducting tapes is presented and the application of these in the constructed resistive type fault current limiter is considered. The experimental set-up and results of testing are presented.
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Pages: 2002-1
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Details
- Original title: The influence of structural defects on the critical current of the high-temperature superconducting tapes.
- Record ID : 2003-2693
- Languages: English
- Source: Cryogenics 2002. Proceedings of the 7th Cryogenics Conference
- Publication date: 2002/04/23
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Indexing
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Standard reference devices for high-temperature...
- Author(s) : GOODRICH L. F., SRIVASTAVA A. N., STAUFFER T. C.
- Date : 1993/12
- Languages : English
- Source: Cryogenics - vol. 33 - n. 12
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Determination of the critical-current density i...
- Author(s) : BEHNER H., RAUCH W., GORNIK E.
- Date : 1992/10
- Languages : English
- Source: Rev. sci. Instrum. - vol. 63 - n. 10
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Magnetic measurement of transport critical-curr...
- Author(s) : GOLDFARB R. B., CROSS R. W., GOODRICH L. F., BERGREN N. F.
- Date : 1993
- Languages : English
- Source: Cryogenics - vol. 33 - n. 1
View record
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Effects of critical current density, equilibriu...
- Author(s) : CHEN D.-X., CROSS R. W., SANCHEZ A.
- Date : 1993
- Languages : English
- Source: Cryogenics - vol. 33 - n. 7
View record
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TECHNIQUE FOR SHORT SAMPLE TESTING OF HIGH CRIT...
- Author(s) : COWEY L., JONES H., DEW-HUGHES D.
- Date : 1988
- Languages : English
- Source: Cryogenics - vol. 28 - n. 3
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