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Tunnel diode oscillator circuit for surface impedance measurement of thin films near 20 megahertz.

Author(s) : OMARI A., KHODER A. F.

Type of article: Article

Summary

The authors describe and analyse a simple method for the measurement of thin film surface impedance in the frequency range 10-20 megahertz. This method is based on the analysis of both the frequency shift and the amplitude variation of the signal in a tunnel diode oscillator circuit inductively coupled to the sample. The sensitivity of the method to the conducting properties of the thin films is a function which is greatly dependent on geometrical parameters and which can be easily optimized and included in the response calculation. The analysis is illustrated by examples with superconducting and normal metal films. The resolution of the measurements is also discussed.

Details

  • Original title: Tunnel diode oscillator circuit for surface impedance measurement of thin films near 20 megahertz.
  • Record ID : 1994-3375
  • Languages: English
  • Source: Cryogenics - vol. 33 - n. 12
  • Publication date: 1993/12

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