ShareA low temperature ultrahigh vacuum scanning force microscope.
Author(s) : HUG H. J., STIEFEL B., SCHENDEL P. J. A. van, et al.
Type of article: Article
Summary
The system allows scanning probe microscopy measurements at temperatures between 6 and 400 K and in magnetic fields up to 7 T. Cantilevers and samples can be prepared in UHV and transferred to the microscope. The authors describe some technical details of the system and present first measurements performed at different temperatures and in various scanning force microscopy operation modes.
Details
- Original title: A low temperature ultrahigh vacuum scanning force microscope.
- Record ID : 2000-2353
- Languages: English
- Source: Rev. sci. Instrum. - vol. 70 - n. 9
- Publication date: 1999/09
- Document available for consultation in the library of the IIR headquarters only.
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Indexing
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- Date : 2001/07
- Languages : English
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- Date : 1999/04
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- Source: Rev. sci. Instrum. - vol. 70 - n. 4
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- Source: Rev. sci. Instrum. - vol. 66 - n. 8
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