Share

Accurate measuring method for total hemispherical emissivity of aluminium at low temperatures.

[In Japanese. / En japonais.]

Author(s) : HIGANO M., OZEKI Y., NAKAMURA K., IBE M., MASUDA H.

Type of article: Article

Summary

To measure total hemispherical emissivities of metals at low temperatures, a new transient calorimetric technique is developed to improve its accuracy. The accuracy of this technique mainly depends upon heat loss through a thermocouple which suspends a specimen and measures its temperature. Heat loss evaluated by a combined radiation and conduction heat transfer analysis, is less than 1% of the total power loss of the specimen. Total hemispherical emissivities for wire and annealed plate are in good agreement with each other, and close to the values extrapolated from the data obtained above room temperature. An increase in total hemispherical emissivities of the plate without annealing may be due to the Beilby/damaged surfaces formed by mechanical polishing.

Details

  • Original title: [In Japanese. / En japonais.]
  • Record ID : 1996-2032
  • Languages: Japanese
  • Source: Cryogenics/ Cryog. Eng. - vol. 30 - n. 2
  • Publication date: 1995
  • Document available for consultation in the library of the IIR headquarters only.

Links


See other articles in this issue (4)
See the source

Indexing