CRITICAL CURRENT DENSITY AND FLUX CREEP IN EPITAXIAL YBCO THIN FILMS.

Author(s) : XIONG G. C.

Type of article: Article

Summary

THE SUPERCONDUCTING TRANSITION AND CRITICAL CURRENT DENSITY WERE STUDIED FOR EPITAXIAL YBCO THIN FILMS AS A FUNCTION OF TEMPERATURE, MAGNETIC FIELD AND ELECTRIC VOLTAGE GRADIENT. A LINEAR SECTION OF THE CURVE OF THE LOGARITHM OF APPARENT VOLTAGE VERSUS TRANSPORT CURRENT DENSITY WAS DISCOVERED IN A REGION OF LOW ELECTRIC VOLTAGE GRADIENT. ACCORDING TO THE ANDERSON-KIM FLUX CREEP MODEL A LINEAR DEPENDENCE IS E THE ACTIVATION ENERGY WAS ESTIMATED FROM THESE MEASUREMENTS.

Details

  • Original title: CRITICAL CURRENT DENSITY AND FLUX CREEP IN EPITAXIAL YBCO THIN FILMS.
  • Record ID : 1991-1957
  • Languages: English
  • Source: Cryogenics - vol. 30 - n. 5
  • Publication date: 1990

Links


See other articles in this issue (13)
See the source