ShareCRITICAL CURRENT DENSITY AND FLUX CREEP IN EPITAXIAL YBCO THIN FILMS.
Author(s) : XIONG G. C.
Type of article: Article
Summary
THE SUPERCONDUCTING TRANSITION AND CRITICAL CURRENT DENSITY WERE STUDIED FOR EPITAXIAL YBCO THIN FILMS AS A FUNCTION OF TEMPERATURE, MAGNETIC FIELD AND ELECTRIC VOLTAGE GRADIENT. A LINEAR SECTION OF THE CURVE OF THE LOGARITHM OF APPARENT VOLTAGE VERSUS TRANSPORT CURRENT DENSITY WAS DISCOVERED IN A REGION OF LOW ELECTRIC VOLTAGE GRADIENT. ACCORDING TO THE ANDERSON-KIM FLUX CREEP MODEL A LINEAR DEPENDENCE IS E THE ACTIVATION ENERGY WAS ESTIMATED FROM THESE MEASUREMENTS.
Details
- Original title: CRITICAL CURRENT DENSITY AND FLUX CREEP IN EPITAXIAL YBCO THIN FILMS.
- Record ID : 1991-1957
- Languages: English
- Source: Cryogenics - vol. 30 - n. 5
- Publication date: 1990
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Indexing
- Themes: Superconduction
- Keywords: Yttrium; Superconduction; Oxide; Copper; Ceramics; Barium; Critical temperature; Superconductor; High temperature; Superconducting film; Film; Critical current; Magnetic field
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- Date : 1990
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- Date : 1990
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