Cryogenics in fundamental metrology.

Author(s) : MARULLO-REEDTZ G.

Summary

During the last two decades new cryogenic phenomena, such as the alternating-current Josephson effect and the quantum Hall effect, have been applied to metrology allowing the electrical units to be referred to the values of fundamental physical constants.

Details

  • Original title: Cryogenics in fundamental metrology.
  • Record ID : 1995-2772
  • Languages: English
  • Source: Proceedings of the 15th international cryogenic engineering conference. ICEC 15.
  • Publication date: 1994/06/07

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