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Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunnelling microscopes.

Author(s) : VANDERVOORT K. G., ZASADZINSKI R. K., GALICIA G. G., CRABTREE G. W.

Type of article: Article

Summary

The authors have calibrated the displacement-voltage response of their piezoelectric scanning tube by imaging graphite at over 40 temperatures between 4 and 300 K. They have also calibrated the response as a function of voltage up to 220 volts at room temperature, imaging a gold-plated diffraction grating. They find that the temperature dependence of the response is linear to within 10% and is reduced by a factor of 5.5 on decreasing temperature from 300 to 4.2 K. The near linearity with temperature of the response makes the lead zirconate titanate composition a convenient choice for low temperature scanning tunnelling microscope piezo tube elements.

Details

  • Original title: Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunnelling microscopes.
  • Record ID : 1994-2824
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 64 - n. 4
  • Publication date: 1993/04
  • Document available for consultation in the library of the IIR headquarters only.

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