ShareFundamentals for electrical resistance measurement at low temperatures.
[In Japanese. / En japonais.]
Author(s) : YOTSUYA T.
Type of article: Article
Details
- Original title: [In Japanese. / En japonais.]
- Record ID : 1993-3058
- Languages: Japanese
- Subject: General information
- Source: Cryogenics/ Cryog. Eng. - vol. 27 - n. 3
- Publication date: 1992
- Document available for consultation in the library of the IIR headquarters only.
Links
See other articles in this issue (4)
See the source
-
ELECTRICAL RESISTIVITY ANISOTROPY OF OSMIUM SIN...
- Author(s) : VOLKENSTEJN N. V.
- Date : 1981
- Languages : Russian
- Source: Fiz. nizk. Temp. - vol. 7 - n. 9
View record
-
The influence of the crystalline structure inho...
- Author(s) : KOUROV N. I.
- Date : 1992/11
- Languages : Russian
- Source: Fiz. nizk. Temp. - vol. 18 - n. 11
View record
-
Current-voltage characteristics of bismuth-base...
- Author(s) : NIKOLAYEVA A. A., RYBALTCHENKO L. F., WOHLLEBEN D.
- Date : 1992/05
- Languages : English
- Source: Fiz. nizk. Temp. - vol. 18 - n. 5
View record
-
THE KAPITZA CONDUCTANCE OF CLEAN COPPER SURFACE...
- Author(s) : PATTULLO A. W., SLUIJS J. C. A. van der
- Date : 1983
- Languages : English
- Source: Cryogenics - vol. 23 - n. 11
View record
-
USE OF RF SQUID FOR ELECTRICAL RESISTANCE MEASU...
- Author(s) : ROMERO J., FLEISCHER T., HUGUENIN R.
- Date : 1990
- Languages : English
- Source: Cryogenics - vol. 30 - n. 2
View record