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LOW COST DATA ACQUISITION SYSTEM FOR TRANSPORT CHARACTERIZATION OF HIGH-CRITICAL TEMPERATURE SUPERCONDUCTORS.

Author(s) : TESSLER L. R.

Type of article: Article

Summary

THE SYSTEM CAN MEASURE THE TEMPERATURE DEPENDENCEOF BOTH THE RESISTANCE AND THE CRITICAL CURRENT. IT UTILIZES THE FOUR-POINT ALTERNATING CURRENT IN-PHASE METHOD TO ELIMINATE THE EFFECTS OF LEAD AND CONTACT RESISTANCE AND THERMAL VOLTAGES. SOME OF THE ADVANTAGES OF THIS METHOD OVER DIRECT CURRENT METHODS ARE POINTED OUT. THE TEMPERATURE IS CONTROLLED BY THE SYSTEM WITH RESOLUTION AND ACCURACY OF 0.1 AND MORE OR LESS 0.5 K, RESPECTIVELY, WHICH ARE THE LIMITS OF THE PLATINUM THERMOMETER USED. VOLTAGES IN THE SAMPLE CAN BEMEASURED WITH A RESOLUTION BETTER THAN 5 NANOVOLTS.

Details

  • Original title: LOW COST DATA ACQUISITION SYSTEM FOR TRANSPORT CHARACTERIZATION OF HIGH-CRITICAL TEMPERATURE SUPERCONDUCTORS.
  • Record ID : 1991-0066
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 61 - n. 2
  • Publication date: 1990
  • Document available for consultation in the library of the IIR headquarters only.

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