ShareLow temperature magnetic force microscopy.
Author(s) : HUG H. J., MOSER A., JUNG T., FRITZ O., WADAS A., PARASHIKOV I., GUNTHERODT H. J.
Type of article: Article
Summary
The authors have built a low temperature scanning force microscope which is able to measure contact and noncontact forces using the direct-current modes of force microscopy. They demonstrate the capabilities of their instrument on a magneto-optical disk at room temperature and at 77 K. Using a ferromagnetic thin film tip, the topography and the micromagnetic stray field of the sample is measured.
Details
- Original title: Low temperature magnetic force microscopy.
- Record ID : 1994-2080
- Languages: English
- Source: Rev. sci. Instrum. - vol. 64 - n. 10
- Publication date: 1993/10
- Document available for consultation in the library of the IIR headquarters only.
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