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Microdefects in relatively fast cooling melt texture growth YBCO specimen.

Author(s) : CHOW J. C. L., FUNG P. C. W., DU Z. L., YU T. F., MOK Y. C.

Type of article: Article

Summary

The authors have carried out a microstructure analysis of an YBCO bulk sample prepared using a simplified version of the melt texture growth process. Using only a 200-kilovolt transmission electron microscope and diamond knife to section the sample, they obtain micrographs showing clear lattice fringes with interference spacing around 13 angströms. The boundaries of the bright and dark regions, which are believed to arise from variations in crystal composition, coincide with the occurrence of stacking faults, twin boundaries and other dislocations. This sample, being full of microdefects, carries a bulk critical current of 17,500 A/cm2.

Details

  • Original title: Microdefects in relatively fast cooling melt texture growth YBCO specimen.
  • Record ID : 1995-0021
  • Languages: English
  • Source: Cryogenics - vol. 34 - n. 3
  • Publication date: 1994/03

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