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Origin of high critical currents YBCO superconducting thin films.

Author(s) : DAM B., HUIJBREGTSE J. M., KLAASSEN F. C., et al.

Type of article: Article

Summary

The authors make use of a sequential etching technique and find that both edge and screw dislocations are the linear defects that provide the strong pinning centres responsible for the high critical currents observed in these thin films. Moreover, they find that the superconducting current density is essentially independent of the density of linear defects at low magnetic fields. These natural linear defects, in contrast to artificially generated columnar defects, exhibit self-organized short-range order, suggesting that YBCO thin films offer an attractive system for investigating the properties of vortex matter in a superconductor with a tailored defect structure.

Details

  • Original title: Origin of high critical currents YBCO superconducting thin films.
  • Record ID : 2000-0597
  • Languages: English
  • Source: Nature - vol. 399 - n. 6735
  • Publication date: 1999/06/03
  • Document available for consultation in the library of the IIR headquarters only.

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