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Structure of lanthanum-aluminium oxide (3)-substrate epitaxial films of YBCO.

[In Russian. / En russe.]

Author(s) : ARINKIN A. V., PALATNIK L. S., STECENKO A. N., FEDORENKO A. I., FUKS G. I., CHIRKIN A. N., ELJUTIN A. V., KNJAZEV S. N., PONOMAREV N. M.

Type of article: Article

Summary

X-ray diffraction studies of the structure of YBCO(-) epitaxial layers deposited on lanthanum-aluminium oxide (3) substrates (111) were carried out. The films are characterized by the existence of three mutually perpendicular systems of domains oriented along a (100)-type direction of the substrate by the axis c. Analysis of the reflection positions makes it possible to reveal a tensile strain of the film which is due to thermal stresses up to 220 megapascals in the film-substrate system.

Details

  • Original title: [In Russian. / En russe.]
  • Record ID : 1993-1849
  • Languages: Russian
  • Source: Fiz. nizk. Temp. - vol. 17 - n. 6
  • Publication date: 1991
  • Document available for consultation in the library of the IIR headquarters only.

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