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TEMPERATURE DEPENDENCE OF EXTENDED X-RAY ABSORPTION FINE STRUCTURE IN THE HIGH-TEMPERATURE SUPERCONDUCTING SYSTEM BSCCO.

Author(s) : LOTTICI P. P., ANTONIOLI G., LICCI F.

Type of article: Article

Summary

MEASUREMENTS OF EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS) HAVE BEENPERFORMED AT THE COPPER-POTASSIUM EDGE BETWEEN 20 AND 300 K IN A HIGH TEMPERATURE, PSEUDO-TETRAGONAL PHASE OF THIS SYSTEM. THE TEMPERATURE DEPENDENCE OF THE EXAFS DISORDER PARAMETER INDICATES STRONG IN-PLANE COPPER-OXYGEN BONDS AND A WEAKER AXIAL COPPER-OXYGEN BOND. THE USUAL EINSTEIN-LIKE BEHAVIOUR OF DISORDER PARAMETER IS FOUND FOR TEMPERATURES ABOVE 100 K, WHEREAS IN THE SUPERCONDUCTING REGION IT INDICATES SOME STRUCTURAL DISORDER RELATED TO THE COPPER AND OXYGEN ATOMS. THIS FACT POINTS OUT THE UNIQUE ROLE OF THE COPPER-OXYGEN LOCAL STRUCTURE IN THE MECHANISM OF SUPERCONDUCTIVITY.

Details

  • Original title: TEMPERATURE DEPENDENCE OF EXTENDED X-RAY ABSORPTION FINE STRUCTURE IN THE HIGH-TEMPERATURE SUPERCONDUCTING SYSTEM BSCCO.
  • Record ID : 1989-1704
  • Languages: English
  • Source: Physica, C - vol. 152 - n. 5
  • Publication date: 1988/07
  • Document available for consultation in the library of the IIR headquarters only.

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