Share

TEXTURED AND EPITAXIED THIN FILMS OF HIGH CRITICAL TEMPERATURE SUPERCONDUCTING MATERIALS: CONTROL AND CHARACTERIZATION OF THE CRYSTAL GROWTH.

COUCHES MINCES TEXTUREES ET EPITAXIEES DE MATERIAUX SUPRACONDUCTEURS A HAUTE TEMPERATURE CRITIQUE : CONTROLE ET CARACTERISATION DE LA CROISSANCE CRISTALLINE.

Author(s) : PERRIN A., GUILLOUX-VIRY M., KARKUT M. G.

Type of article: Article

Summary

THE CHARACTERISTICS OF < GOOD > QUALITY THIN FILMS OF HIGH CRITICAL TEMPERATURE SUPERCONDUCTING MATERIALS ARE DEFINED AND THE USEFUL METHODS TO OBTAIN THEM ARE BRIEFLY DESCRIBED, POINTING OUT THE IMPORTANCE OF GROWING EPITAXIAL OR AT LEAST HIGHLY TEXTURED THIN FILMS. A NUMBER OF TECHNIQUES ALLOWING THE CHARACTERIZATION OF CRYSTAL GROWTH OF THE FILMS ARE REVIEWED, INCLUDING A VARIETY OF X-RAY DIFFRACTION CONFIGURATIONS, STANDARD ELECTRON DIFFRACTION AND RHEED, AND RUTHERFORD BACKSCATTERING EXPERIMENTS. EXAMPLES OF APPLICATION ARE GIVEN FOR THE YBCO SYSTEM BECAUSE IT HAS BEENTHE MOST EXTENSIVELY STUDIED.

Details

  • Original title: COUCHES MINCES TEXTUREES ET EPITAXIEES DE MATERIAUX SUPRACONDUCTEURS A HAUTE TEMPERATURE CRITIQUE : CONTROLE ET CARACTERISATION DE LA CROISSANCE CRISTALLINE.
  • Record ID : 1991-2419
  • Languages: French
  • Source: Vide Couches minces - vol. 46 - n. 254
  • Publication date: 1990
  • Document available for consultation in the library of the IIR headquarters only.

Links


See the source

Indexing