ShareWIDE RANGE TEMPERATURE COMPENSATED CRYOGENIC SCANNING TUNNELLING MICROSCOPE.
Author(s) : BURGER J., MEEPAGALA S. C., WOLF E. L.
Type of article: Article
Summary
THE AUTHORS DESCRIBE A COMPACT SCANNING TUNNELLING MICROSCOPE USING PIEZOELECTRIC BIMORPH ELEMENTS TO ACHIEVE A LARGE SCANNING AREA OF 20 SQUARE MICROMETERS AT 4.2 K. THIS INSTRUMENT PROVIDES INHERENT TEMPERATURE COMPENSATION, COMPATIBILITY WITH A HIGH MAGNETIC FIELD ENVIRONMENT, AND A NOVEL MEANS OF ROUGH SAMPLE-TIP (Z) ADJUSTMENT.
Details
- Original title: WIDE RANGE TEMPERATURE COMPENSATED CRYOGENIC SCANNING TUNNELLING MICROSCOPE.
- Record ID : 1990-0467
- Languages: English
- Source: Rev. sci. Instrum. - vol. 60 - n. 4
- Publication date: 1989
- Document available for consultation in the library of the IIR headquarters only.
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