ShareCapacitance cell measurement of the out-of-plane expansion of thin films.
Author(s) : NIST, SNYDER C. R., MOPSIK F. I.
Type of monograph: Guide/Handbook, Booklet
Summary
The document provides guidance for construction and use of a capacitance-based technique for determining the coefficient of thermal expansion of films with thicknesses ranging from 2 micrometers up to 1 centimetre. The guide can be downloaded from the following Web site: www.nist.gov/practiceguides.
Details
- Original title: Capacitance cell measurement of the out-of-plane expansion of thin films.
- Record ID : 2004-0984
- Languages: English
- Subject: Regulation
- Publication: US Department of Commerce, NIST (National Institute of Standards and Technology) - United states/United states
- Publication date: 2003
- Collection:
- Source: Source: NIST SP 960-7; 44 p. (15 x 23); fig.; 22 ref.; append.
- Document available for consultation in the library of the IIR headquarters only.
Indexing
-
NIST calibration services users guide. 1998 edi...
- Author(s) : NIST, MARSHALL J. L.
- Date : 1998/01
- Languages : English
View record
-
NIST measurement services. NIST calibration ser...
- Author(s) : NIST, WRIGHT J. D., MATTINGLY G. E.
- Date : 1998/08
- Languages : English
View record
-
STANDARD METHODS OF MEASUREMENT OF FLOW OF LIQU...
- Date : 1989
- Languages : English
- Source: ASHRAE Stand. - ANSI-ASHRAE 41.8-1989; 14 p.; 4 fig.; 5 tabl.; 4 ref.
View record
-
METHOD OF TESTING FOR RATING THE PERFORMANCE OF...
- Date : 1991
- Languages : English
- Source: ASHRAE Stand. - ANSI-ASHRAE 70-1991; 12 p.; 8 fig.; 2 tabl.; 4 ref.; 3 append.
View record
-
State weights and measures laboratories. Progra...
- Author(s) : NIST, HARRIS G. L.
- Date : 2003/04
- Languages : English
View record