ShareCRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH COMMON DIODES.
Author(s) : TALPE J., STOLOVITZKY G., BEKERIS V.
Type of article: Article
Summary
COMMON SILICON DIODES, MANUFACTURED FOR ROOM TEMPERATURE ELECTRONICS, HAVE BEEN USED SUCCESSFULLY BOTH FOR THERMOMETRY DOWN TO 4 K AND FOR LIQUID HELIUM LEVEL MONITORING. AGING HAS BEEN CHECKED AND A NOVEL LEVEL DETECTOR IS FULLY DESCRIBED.
Details
- Original title: CRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH COMMON DIODES.
- Record ID : 1988-2224
- Languages: English
- Source: Cryogenics - vol. 27 - n. 12
- Publication date: 1987
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Indexing
- Themes: Thermodynamic measurements
- Keywords: Helium; Electronics; Cryotemperature; Measurement; Thermometry; Silicon; Diode
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- Date : 1980
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- Author(s) : VEPREK J., STRNAD P.
- Date : 1984
- Languages : English
- Source: Cryogenics - vol. 24 - n. 5
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- Author(s) : MCDONALD P. C.
- Date : 1995/03
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- Source: Cryogenics - vol. 35 - n. 3
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MINIATURE SILICON DIODE THERMOMETERS FOR CRYOGE...
- Author(s) : RAO M. G., SCURLOCK R. G., WU Y. Y.
- Date : 1983
- Languages : English
- Source: Cryogenics - vol. 23 - n. 12
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