CRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH COMMON DIODES.
Author(s) : TALPE J., STOLOVITZKY G., BEKERIS V.
Type of article: Article
Summary
COMMON SILICON DIODES, MANUFACTURED FOR ROOM TEMPERATURE ELECTRONICS, HAVE BEEN USED SUCCESSFULLY BOTH FOR THERMOMETRY DOWN TO 4 K AND FOR LIQUID HELIUM LEVEL MONITORING. AGING HAS BEEN CHECKED AND A NOVEL LEVEL DETECTOR IS FULLY DESCRIBED.
Details
- Original title: CRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH COMMON DIODES.
- Record ID : 1988-2224
- Languages: English
- Source: Cryogenics - vol. 27 - n. 12
- Publication date: 1987
Links
See other articles in this issue (4)
See the source
Indexing
- Themes: Thermodynamic measurements
- Keywords: Helium; Electronics; Cryotemperature; Measurement; Thermometry; Silicon; Diode
-
SEMICONDUCTOR DIODES AS CRYOGENIC TEMPERATURE S...
- Author(s) : MAITI C. R., MITRA S. S., GHORAI S. K.
- Date : 1980
- Languages : English
- Source: Indian J. Cryog. - vol. 5 - n. 1
View record
-
Low temperature current-voltage characteristics...
- Author(s) : SZMYRKA-GRZEBYK A., LIPINSKI L.
- Date : 1993
- Languages : English
- Source: Cryogenics - vol. 33 - n. 2
View record
-
Silicon diode temperature sensors for process s...
- Author(s) : MCDONALD P. C.
- Date : 1995/03
- Languages : English
- Source: Cryogenics - vol. 35 - n. 3
View record
-
THE USE OF MINIATURE SILICON DIODE THERMOMETERS...
- Author(s) : RAO M. G., SCURLOCK R. G.
- Date : 1987/08/24
- Languages : English
- Source: Development in refrigeration, refrigeration for development. Proceedings of the XVIIth international Congress of Refrigeration.
- Formats : PDF
View record
-
Study of forward characteristics of a cryogenic...
- Author(s) : BOSE M., OTA S. B.
- Date : 1996/12
- Languages : English
- Source: Rev. sci. Instrum. - vol. 67 - n. 12
View record