CRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH COMMON DIODES.

Author(s) : TALPE J., STOLOVITZKY G., BEKERIS V.

Type of article: Article

Summary

COMMON SILICON DIODES, MANUFACTURED FOR ROOM TEMPERATURE ELECTRONICS, HAVE BEEN USED SUCCESSFULLY BOTH FOR THERMOMETRY DOWN TO 4 K AND FOR LIQUID HELIUM LEVEL MONITORING. AGING HAS BEEN CHECKED AND A NOVEL LEVEL DETECTOR IS FULLY DESCRIBED.

Details

  • Original title: CRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH COMMON DIODES.
  • Record ID : 1988-2224
  • Languages: English
  • Source: Cryogenics - vol. 27 - n. 12
  • Publication date: 1987

Links


See other articles in this issue (4)
See the source