ShareSummary
THERMOMETRIC PROPERTIES OF TESLA-KA 136 SILICON DIODES AS TEMPERATURE SENSORS IN THE RANGE 1.5-380 K ARE PRESENTED. SPECIAL ATTENTION IS PAID TO THE STABILITY OF THESE SENSORS WHICH WAS EXAMINED FOR 30 DIODES. IT HAS BEEN FOUND THAT MORE THAN 90% OF THE DIODES CONSIDERED HAVE A STABILITY BETTER THAN 0.4 AND 0.3 K AT TEMPERATURES 4.2 AND 273 K, RESPECTIVELY, AFTER 30 CYCLES AND 12 MONTHS STORAGE.
Details
- Original title: STABILITY OF SILICON DIODES AS TEMPERATURE SENSORS IN THE RANGE 4.2-273 K.
- Record ID : 1985-0495
- Languages: English
- Source: Cryogenics - vol. 24 - n. 5
- Publication date: 1984
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Indexing
- Themes: Thermodynamic measurements
- Keywords: Cryotemperature; Measurement; Thermometry; Stability; Probe; Silicon
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CRYOGENIC THERMOMETRY AND LEVEL DETECTION WITH ...
- Author(s) : TALPE J., STOLOVITZKY G., BEKERIS V.
- Date : 1987
- Languages : English
- Source: Cryogenics - vol. 27 - n. 12
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SEMICONDUCTOR DIODES AS CRYOGENIC TEMPERATURE S...
- Author(s) : MAITI C. R., MITRA S. S., GHORAI S. K.
- Date : 1980
- Languages : English
- Source: Indian J. Cryog. - vol. 5 - n. 1
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STABILITY OF SOME CRYOGENIC CARBON RESISTANCE T...
- Author(s) : BESLEY L. M.
- Date : 1983
- Languages : English
- Source: Rev. sci. Instrum. - vol. 54 - n. 9
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STABILITY OF INDUSTRIAL GRADE PLATINUM RESISTAN...
- Author(s) : VEPREK J.
- Date : 1987
- Languages : English
- Source: Cryogenics - vol. 27 - n. 4
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MINIATURE SILICON DIODE THERMOMETERS FOR CRYOGE...
- Author(s) : RAO M. G., SCURLOCK R. G., WU Y. Y.
- Date : 1983
- Languages : English
- Source: Cryogenics - vol. 23 - n. 12
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