ShareCryogenic variable temperature ultrahigh vacuum scanning tunnelling microscope.
Author(s) : FOLEY E. T., KAM A. F., LYDING J. W.
Type of article: Article
Summary
A cryogenic variable temperature ultrahigh vacuum (UHV) scanning tunnelling microscope (STM) has been developed. This design utilizes a novel vibration isolation that provides an active thermal link to the cooling source without the standard tradeoff of compromising mechanical isolation. A welded bellows serves as the basis for the vibration isolation system. This bellows houses a heat exchanger which uses helium gas to form a thermal link between the STM and the cryogenic. This STM is fully integrated into a multichamber UHV STM system now in place in the authors' laboratory and atomic resolution operation is demonstrated from 11 to 300 K.
Details
- Original title: Cryogenic variable temperature ultrahigh vacuum scanning tunnelling microscope.
- Record ID : 2003-0008
- Languages: English
- Source: Rev. sci. Instrum. - vol. 71 - n. 9
- Publication date: 2000/09
- Document available for consultation in the library of the IIR headquarters only.
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Indexing
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Integrated cryogenic scanning tunnelling micros...
- Author(s) : TESSMER S. H., HARLINGEN D. J. van, LYDING J. W.
- Date : 1994/09
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 9
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A low temperature, ultrahigh vacuum, microwave-...
- Author(s) : STRANICK S. J., KAMNA M. M., WEISS P. S.
- Date : 1994/10
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 10
View record
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Low-temperature scanning tunnelling microscope ...
- Author(s) : WILDOER J. W. G., ROY A. J. A. van, KEMPEN H. van, HARMANS C. J. P. M.
- Date : 1994/09
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 9
View record
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New variable low-temperature scanning tunnellin...
- Author(s) : SMITH A. R., SHIH C. K.
- Date : 1995/03
- Languages : English
- Source: Rev. sci. Instrum. - vol. 66 - n. 3
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An atomic-resolution cryogenic scanning tunneli...
- Author(s) : CHEN X., FRANK E. R., HAMERS R. J.
- Date : 1994/11
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 11
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