An atomic-resolution cryogenic scanning tunneling microscope.

Author(s) : CHEN X., FRANK E. R., HAMERS R. J.

Type of article: Article

Summary

The design features simple in situ exchange of samples and tips, active cooling of the sample, excellent visibility of the sample-tip region, and the use of a thermally isolated inchworm translator for coarse approach. It has demonstrated atomic resolution on silicon (111)-(7 x 7) and silicon (001) surfaces at 120 K.

Details

  • Original title: An atomic-resolution cryogenic scanning tunneling microscope.
  • Record ID : 1996-1372
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 65 - n. 11
  • Publication date: 1994/11
  • Document available for consultation in the library of the IIR headquarters only.

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