ShareDesign and implementation of a low temperature near-field scanning optical microscope.
Author(s) : GROBER R. D., HARRIS T. D., TRAUTMAN J. K., BETZIG E.
Type of article: Article
Summary
The design and implementation of a low temperature (higher or equal to 1.5 K), near-field scanning optical microscope are described. This microscope, which is based on the recently developed tapered fiber probe, is optimized for luminescence imaging and spectroscopy of mesoscopic semiconductor systems.
Details
- Original title: Design and implementation of a low temperature near-field scanning optical microscope.
- Record ID : 1995-0035
- Languages: English
- Source: Rev. sci. Instrum. - vol. 65 - n. 3
- Publication date: 1994/03
- Document available for consultation in the library of the IIR headquarters only.
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Low-temperature scanning tunnelling microscope ...
- Author(s) : WILDOER J. W. G., ROY A. J. A. van, KEMPEN H. van, HARMANS C. J. P. M.
- Date : 1994/09
- Languages : English
- Source: Rev. sci. Instrum. - vol. 65 - n. 9
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- Author(s) : SCHULZ R. R., ROSSEL C.
- Date : 1994/06
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- Source: Rev. sci. Instrum. - vol. 65 - n. 6
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Characterization of piezoceramic crosses with l...
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- Date : 1995/10
- Languages : English
- Source: Rev. sci. Instrum. - vol. 66 - n. 10
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- Author(s) : FEIN A. P., KIRTLEY J. R., FEENSTRA R. M.
- Date : 1987
- Languages : English
- Source: Rev. sci. Instrum. - vol. 58 - n. 10
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- Author(s) : SADORF H.
- Date : 1987
- Languages : English
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