Film thickness dependence of critical-current density for YBCO films post-annealed at a low oxygen partial pressure.

Author(s) : MOGRO-CAMPERO A., TURNER L. G.

Type of article: Article

Summary

The critical-current density at 77 K exceeds 1 MA/cm2 for the thinner films, and decreases with increasing film thickness in excess of about 0.4 micrometer. A good anticorrelation was found between room-temperature resistivity and critical-current density at 77 K. The results are compared to those obtained before by post-annealing at 850 deg C in 1 atm of oxygen (instead of 750 deg C and 29 pascals).

Details

  • Original title: Film thickness dependence of critical-current density for YBCO films post-annealed at a low oxygen partial pressure.
  • Record ID : 1994-2076
  • Languages: English
  • Source: J. Supercond. - vol. 6 - n. 1
  • Publication date: 1993/02
  • Document available for consultation in the library of the IIR headquarters only.

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