Film thickness dependence of critical-current density for YBCO films post-annealed at a low oxygen partial pressure.
Author(s) : MOGRO-CAMPERO A., TURNER L. G.
Type of article: Article
Summary
The critical-current density at 77 K exceeds 1 MA/cm2 for the thinner films, and decreases with increasing film thickness in excess of about 0.4 micrometer. A good anticorrelation was found between room-temperature resistivity and critical-current density at 77 K. The results are compared to those obtained before by post-annealing at 850 deg C in 1 atm of oxygen (instead of 750 deg C and 29 pascals).
Details
- Original title: Film thickness dependence of critical-current density for YBCO films post-annealed at a low oxygen partial pressure.
- Record ID : 1994-2076
- Languages: English
- Source: J. Supercond. - vol. 6 - n. 1
- Publication date: 1993/02
- Document available for consultation in the library of the IIR headquarters only.
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Indexing
- Themes: Superconduction
- Keywords: Superconduction; Oxygen; YBCO; Superconductor; Superconducting film; Current density; Critical current
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