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STRAIN EFFECTS ON THE CRITICAL CURRENT DENSITY IN SUPERCONDUCTING NIOBIUM NITRIDE TAPES PREPARED BY REACTIVE SPUTTERING.

[In Japanese. / En japonais.]

Author(s) : SUZUKI M.

Type of article: Article

Summary

THE STRAIN EFFECT ON THE CRITICAL CURRENT DENSITY OF NIOBIUM NITRIDE TAPES WAS INVESTIGATED AT 4.2 K AND 9 T. THE NIOBIUM NITRIDE TAPES WITH HASTELLOY B SUBSTRATE MAINTAINED CONSTANT VALUES OF CRITICAL CURRENT DENSITY UP TO STRAIN VALUES OF ABOVE 1 %. THOSE WITH 304 STAINLESS STEEL SUBSTRATE SHOWED A GRADUAL DECREASE IN CRITICAL CURRENT DENSITY FROM 0.3 TO 0.9 % AND EXHIBITED A MARKED DECREASE IN THE RANGE OF ABOVE ABOUT 0. . THE MAXIMUM VALUE OF THE IRREVERSIBLE STRAIN LIMIT WAS ABOUT 1.4 % AND WAS OBTAINED IN THTN B SUBSTRATE AND A 3,000 ANGSTROMS NIOBIUM NITRIDE FILM. IN TAPES THICKLY COATED WITH NIOBIUM NITRIDE, WHICH WERE MEASURED UP TO ABOVE THEIR IRREVERSIBLE STRAIN LIMIT VALUES, SOME CRACKS WERE FOUND, AND FILMS OF NIOBIUM NITRIDE FREQUENTLY PEELED OFF THEIR SUBSTRATES.

Details

  • Original title: [In Japanese. / En japonais.]
  • Record ID : 1992-0994
  • Languages: Japanese
  • Source: Cryogenics/ Cryog. Eng. - vol. 25 - n. 6
  • Publication date: 1990
  • Document available for consultation in the library of the IIR headquarters only.

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