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IRREGULARITY IN NIOBIUM-TITANIUM FILAMENT AREA AND ELECTRIC FIELD VERSUS CURRENT CHARACTERISTICS.

Author(s) : EKIN J. W.

Type of article: Article

Summary

THERE IS A CORRELATION BETWEEN IRREGULARITY IN FILAMENT AREA (< SAUSAGING >) AND THE SHAPE OF A SUPERCONDUCTOR'S ELECTRIC FIELD (E) VERSUS CURRENT (I) RELATIONSHIP. THESHAPE OF THE E-I CHARACTERISTIC IS QUANTIFIED IN TERMS OF THE RESISTIVE TRANSITION PARAMETER, N. LOW VALUES OF N LESS THAN ABOUT 20 CORRELATE WITH A WIDE FILAMENT DIAMETER DISTRIBUTION, WHILE N VALUES OVER 50 CORRESPOND TO A DISTRIBUTIONMORE THAN 2.5 TIMES SMALLER. IT IS PROPOSED THAT THE LOW-FIELD (CONSTANT) VALUE OF N BE USED AS AN INDEX OF FILAMENT QUALITY IN EVALUATING DIFFERENT SUPERCONDUCTORS FOR PRACTICAL APPLICATIONS. A MODEL IS ALSO SUGGESTED TO EXPLAIN THIS EFFECT IN TERMS OF A LOCALLY DEPRESSED FILAMENT CRITICAL CURRENT, WHICH FORCES CURRENT TO TRANSFER ACROSS THE NORMAL MATRIX MATERIAL INTO NEIGHBOURING FILAMENTS.

Details

  • Original title: IRREGULARITY IN NIOBIUM-TITANIUM FILAMENT AREA AND ELECTRIC FIELD VERSUS CURRENT CHARACTERISTICS.
  • Record ID : 1988-2184
  • Languages: English
  • Source: Cryogenics - vol. 27 - n. 11
  • Publication date: 1987

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