RECENT DEVELOPMENTS IN CRYOGENIC THERMOMETRY.

Author(s) : PAL A. K.

Type of article: Article

Summary

THIS ARTICLE DEALS WITH RECENT DEVELOPMENTS IN CRYOGENIC THERMOMETERS AND STUDIES THE CHARACTERISTICS, SENSITIVITY, STABILITY, TEMPERATURE RANGE AND SPECIFIC USE OF RESISTANCE THERMOMETERS (RHODIUM-IRON, CARBON COMPOSITION, P GALLIUM-ANTIMONY), ACTIVE SEMICONDUCTOR DEVICE THERMOMETERS (GALLIUMARSENID DIODES, UNIJUNCTION TRANSISTORS, LIGHT EMITTING DIODES, SILICON SWITCHING DIODES), CAPACITANCE AND THERMOCOUPLE THERMOMETERS. FROM RECENT EXPERIMENTS, THE LAMBDA-POINT OF HELIUM 4 SEEMS TO BE AN INTERESTING NEW THERMOMETRIC FIXED POINT FOR CALIBRATION AND TESTING OF SECONDARY TEMPERATURE STANDARDS. J. V.

Details

  • Original title: RECENT DEVELOPMENTS IN CRYOGENIC THERMOMETRY.
  • Record ID : 1982-0729
  • Languages: English
  • Source: Indian J. Cryog. - vol. 5 - n. 1
  • Publication date: 1980
  • Document available for consultation in the library of the IIR headquarters only.

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