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REPRODUCIBILITY OF TRANSITION TEMPERATURE AND CRITICAL CURRENT DENSITY OF THIN FILMS OF YBCO ON LANTHANUM-ALUMINIUM MIXED OXIDE.

Author(s) : MOGRO-CAMPERO A., TURNER L. G.

Type of article: Article

Summary

THE ZERO RESISTANCE TRANSITION TEMPERATURE IS HIGH (89 OR 90 K) IF THE FILM COMPOSITION IS PHASE PURE (BARIUM/YTTRIUM = 2, COPPER/YTTRIUM = 3) OR IF IT IS ENRICHED IN BARIUM AND COPPER. FOR THESE COMPOSITIONS THE CRITICAL CURRENT DENSITY AT 77 K HAS AN AVERAGEVALUE OF 200,000 A/CM2, WITH A TENDENCY FOR DECREASING CRITICAL CURRENT DENSITY WITH INCREASING FILM THICKNESS (0.2 TO 0.8 MICROMETER). VARIATIONS IN CRITICAL CURRENT DENSITY ARE NOT CORRELATED WITH DEVIATIONS FROM IDEAL STOICHIOMETRY. STEEPER SLOPES OF THE RESISTANCE-TEMPERATURE CURVES ABOVE 100 K AND LOWER VALUES OF THE ROOM-TEMPERATURE RESISTIVITY ARE ASSOCIATED WITH HIGH VALUES OF CRITICAL CURRENT DENSITY. IF THE FILM COMPOSITION IS ENRICHED IN YTTRIUM RELATIVE TO BARIUM AND COPPER, THE TRANSITION TEMPERATURE DECREASES BY SEVERAL DEGREES.

Details

  • Original title: REPRODUCIBILITY OF TRANSITION TEMPERATURE AND CRITICAL CURRENT DENSITY OF THIN FILMS OF YBCO ON LANTHANUM-ALUMINIUM MIXED OXIDE.
  • Record ID : 1992-0965
  • Languages: English
  • Source: J. Supercond. - vol. 4 - n. 1
  • Publication date: 1991/02
  • Document available for consultation in the library of the IIR headquarters only.

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