Scanning electron microscopy: a powerful tool for characterization of lyophilised materials.
Microscopía electrónica de barrido: potente herramienta para caracterización de materiales liofilizados.
Author(s) : JALANTI T., REY L.
Type of article: Article
Summary
Analytical scanning electron microscopy (SEM and EDX) yields information on geometric and chemical (morphochemical) structure of solid material. Specific problems and solutions related to the observation and specimen preparation of lyophilised material are described.
Available documents
Format PDF
Pages: 14-18 (4 p.)
Available
Public price
20 €
Member price*
15 €
* Best rate depending on membership category (see the detailed benefits of individual and corporate memberships).
Details
- Original title: Microscopía electrónica de barrido: potente herramienta para caracterización de materiales liofilizados.
- Record ID : 30004759
- Languages: Spanish
- Source: Frío Calor Aire acondicionado - vol. 40 - n. 446
- Publication date: 2012/04
Links
- See translations: Scanning electron microscopy: a powerful tool for characterization of lyophilised materials.
See other articles in this issue (3)
See the source
Indexing
- Themes: Freeze drying: general information
- Keywords: Imaging; Freeze-drying; Electronics; Process; Particle; Microscopy; Control (generic)
-
THE CONTROL OF FREEZE-DRYING WITH DEUTERIUM OXI...
- Author(s) : WILDHABER L.
- Date : 1982
- Languages : English
- Source: J. Ultrastruct. Res. - vol. 80 - n. 3
View record
-
Importancia de la humedad residual en productos...
- Author(s) : MAY J. C.
- Date : 2009/10
- Languages : Spanish
- Source: IIF-IIR/Frío Calor Aire acond. - vol. 37 - n. 418
- Formats : PDF
View record
-
A SIMPLE METHOD OF FREEZE-DRYING FOR SCANNING E...
- Author(s) : OSATAKE H.
- Date : 1980
- Languages : English
- Source: Electron-Microsc. - vol. 29 - n. 1
View record
-
AUTOMATIC CONTROL SYSTEM FOR VACUUM FREEZE-DRYING.
- Author(s) : SIL'VESTROV E. V.
- Date : 1987
- Languages : Russian
- Source: Kholodilnaya Tekhnika - n. 5
View record
-
EXAMINATION OF REAL AND VIRTUAL LEAKS IN VACUUM...
- Author(s) : JENNINGS T. A.
- Date : 1982
- Languages : English
- Source: J. parenter. Sci. Technol. - vol. 36 - n. 4
View record