Semiconductor thermometry at low and ultra-low temperatures using dislocation-doped germanium.

Author(s) : KOZHUCH M. L.

Type of article: Article

Details

  • Original title: Semiconductor thermometry at low and ultra-low temperatures using dislocation-doped germanium.
  • Record ID : 1993-3256
  • Languages: English
  • Source: Cryogenics - vol. 32 - n. 6
  • Publication date: 1992

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