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DESCRIPTION OF A MEASURING APPARATUS FOR INVESTIGATING THE RESISTANCE OF MATERIALS UNDER HIGH PRESSURE AND LOW TEMPERATURE. APART FROM THE EFFECTS OF TEMPERATURE, PRESSURE AND HARDNESS OF THE MATERIAL, THE SUPERFICIAL LAYERS OF THE MATERIAL HAVE AN INFLUENCE UPON ITS RESISTANCE WHICH INCREASES WITH REDUCTIONS IN TEMPERATURE.
Details
- Original title: [In Polish. / En polonais.]
- Record ID : 1983-0902
- Languages: Polish
- Source: Chlodnictwo - vol. 17 - n. 1-4
- Publication date: 1982
- Document available for consultation in the library of the IIR headquarters only.
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Indexing
- Themes: Thermodynamic measurements
- Keywords: Mechanical property; Measurement; Pressure; Crystal
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MINIATURIZED PIEZO-ELECTRIC SENSOR.
- Date : 1989
- Languages : Russian
- Source: Kholodilnaya Tekhnika - n. 1
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DEVELOPMENT OF AN EXTENSOMETER FOR USE AT CRYOG...
- Author(s) : KATAOKA T., INOUE H., YAMAMOTO J.
- Date : 1988
- Languages : Japanese
- Source: Cryogenics/ Cryog. Eng. - vol. 23 - n. 3
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EXPERIMENTAL EXAMINATION OF THEORY OF CTE (COEF...
- Author(s) : ISHIKAWA T.
- Date : 1991/04
- Languages : English
- Source: JSME int. J., Ser. I - vol. 34 - n. 2
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LOW-TEMPERATURE DIFFERENTIAL DILATOMETER.
- Author(s) : OKAJI M., NARA K., KATO H.
- Date : 1991
- Languages : Japanese
- Source: Cryogenics/ Cryog. Eng. - vol. 26 - n. 3
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On-line monitoring and control of thermal stres...
- Author(s) : BANASZKIEWICZ M.
- Date : 2016/02/05
- Languages : English
- Source: Applied Thermal Engineering - vol. 94
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