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THERMAL CONDUCTIVITY MEASUREMENT FROM 30 TO 750 K.

Author(s) : CAHILL D. G.

Type of article: Article

Summary

AN ALTERNATING CURRENT TECHNIQUE FOR MEASURING THE THERMAL CON DUCTIVITY OF DIELECTRIC SOLIDS BETWEEN 30 AND 750 K IS DESCRIBED. THIS TECHNIQUE CAN BE APPLIED TO BULK AMORPHOUS SOLIDS AND CRYSTALS AS WELL AS AMORPHOUS FILMS TENS OF MICRONS THICK.

Details

  • Original title: THERMAL CONDUCTIVITY MEASUREMENT FROM 30 TO 750 K.
  • Record ID : 1991-0134
  • Languages: English
  • Source: Rev. sci. Instrum. - vol. 61 - n. 2
  • Publication date: 1990
  • Document available for consultation in the library of the IIR headquarters only.

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