Thin film thallium-based high-temperature superconducting microwave devices.

Summary

The authors have designed and tested microstrip resonators, fabricated from TBCCO 2212 thin films deposited by radiofrequency sputtering onto 10 x 10 mm and 20 x 20 mm lanthanum-aluminium oxide substrates. The surface resistance of such films has been measured at 24 gigahertz using a sapphire dielectric resonator and shown to be less than 500 micro-ohms scaled to 10 gigahertz and at 80 K. Q values of 3-12 gigahertz disk resonators have demonstrated considerable improvements when compared to both linear high-temperature superconducting microstrip resonators and comparable copper disk resonators.

Details

  • Original title: Thin film thallium-based high-temperature superconducting microwave devices.
  • Record ID : 1998-2696
  • Languages: English
  • Publication date: 1998/02
  • Source: Source: J. Supercond./Proc. int. Workshop Thallium Mercury based supercond. Mater., Cambridge
    vol. 11; n. 1; 5-8; 7 fig.; 14 ref.
  • Document available for consultation in the library of the IIR headquarters only.